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Volumn 82, Issue 1-3, 2001, Pages 42-44
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High etching rate of GaN films by KrF excimer laser
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Author keywords
Atmosphere pressure; Environmental conditions; GaN; KrF excimer laser; Low pressure
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Indexed keywords
ETCHING;
EXCIMER LASERS;
LASER ABLATION;
MORPHOLOGY;
PRESSURE EFFECTS;
PULSED LASER APPLICATIONS;
SEMICONDUCTING GALLIUM COMPOUNDS;
HIGH ETCHING RATES;
LASER ETCHING;
SEMICONDUCTING FILMS;
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EID: 0035933083
PISSN: 09215107
EISSN: None
Source Type: Journal
DOI: 10.1016/S0921-5107(00)00696-6 Document Type: Article |
Times cited : (12)
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References (7)
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