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Volumn 82, Issue 1-3, 2001, Pages 42-44

High etching rate of GaN films by KrF excimer laser

Author keywords

Atmosphere pressure; Environmental conditions; GaN; KrF excimer laser; Low pressure

Indexed keywords

ETCHING; EXCIMER LASERS; LASER ABLATION; MORPHOLOGY; PRESSURE EFFECTS; PULSED LASER APPLICATIONS; SEMICONDUCTING GALLIUM COMPOUNDS;

EID: 0035933083     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(00)00696-6     Document Type: Article
Times cited : (12)

References (7)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.