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Journal of Electroanalytical Chemistry

Volumn 511, Issue 1-2, 2001, Pages 13-19

An in situ spectrochemical study of the reduction of thin fullerene films

(5) Kvarnstrom C a,c Neugebauer, H a Kuzmany, H b Sitter, H a Sariciftci, N S a

a JOHANNES KEPLER UNIVERSITY LINZ (Austria)

b UNIVERSITY OF VIENNA (Austria)

c ÅBO AKADEMI UNIVERSITY (Finland)

Author keywords

Cyclic voltammetry; Doping; FTIR spectroscopy; Fullerene; Internal reflection spectroelectrochemistry; Reduction

Indexed keywords

BAND STRUCTURE; CYCLIC VOLTAMMETRY; ELECTROCHEMICAL ELECTRODES; ELECTROLYTES; EPITAXIAL GROWTH; FOURIER TRANSFORM INFRARED SPECTROSCOPY; POSITIVE IONS; REDUCTION; THIN FILMS;

HOT WALL BEAM EPITAXY FILMS;

FULLERENES;

EID: 0035928948 PISSN: 00220728 EISSN: None Source Type: Journal
DOI: 10.1016/S0022-0728(01)00540-X Document Type: Article

Times cited : (24)

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