Investigations of fullerene thin films with in situ FTIR spectroelectrochemistry

Synthetic Metals

Volumn 103, Issue 1-3, 1999, Pages 2430-2431

  Kvarnstrom C ^a,b   Neugebauer, H ^a   Matt, G ^a   Sitter, H ^a   Sariciftci, N S ^a  

^a JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

^b ÅBO AKADEMI UNIVERSITY   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

CYCLIC VOLTAMMETRY; DOPING (ADDITIVES); ELECTROCHEMISTRY; FILM PREPARATION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; MOLECULAR BEAM EPITAXY; REDUCTION; TEMPERATURE CONTROL;

ATTENUATED TOTAL REFLECTION TECHNIQUE; ELECTROCHEMICAL DOPING; SPECTROELECTROCHEMISTRY;

FULLERENES;

EID: 0033138053     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0379-6779(98)00707-3     Document Type: Article

References (7)

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