PEEM imaging of dopant contrast in Si(001)

Surface Science

Volumn 461, Issue 1-3, 2000, Pages

  Ballarotto, V W ^a   Siegrist, K ^a   Phaneuf, R J ^a   Williams, E D ^a   Mogren, S ^b  

^a LABORATORY FOR PHYSICAL SCIENCES   (United States)

^b Microelectronics Research Laboratory   (United States)

Author keywords

Electron microscopy; Photoelectron emission; Photoemission (total yield); Semi empirical models and model calculations; Silicon; Surface electronic phenomena (work function, surface potential, surface states, etc.)

Indexed keywords

EID: 0012822973     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(00)00619-1     Document Type: Article

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