Visualization of 3D-SIMS measurements

Applied Surface Science

Volumn 179, Issue 1-4, 2001, Pages 161-166

  Hutter, H ^a   Nowikow, K ^a   Gammer, K ^a  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

3D SIMS; Channel plate correction; Visualization toolkit

Indexed keywords

C (PROGRAMMING LANGUAGE); COMPUTER SOFTWARE; SUBROUTINES; THREE DIMENSIONAL COMPUTER GRAPHICS; VISUALIZATION;

SOFTWARE PACKAGE VISUALIZER;

SECONDARY ION MASS SPECTROMETRY;

EID: 0035898776     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(01)00276-8     Document Type: Article

References (15)

1. Imaging surface spectrometry for two and three dimensional characterization of materials
2. 3D stereometric analysis of materials with SIMS
3. Topochemical characterization of materials with 3D-SIMS