Effect of the Cu capping thickness on the magnetic properties of thin Ni/Cu(001) films

Journal of Magnetism and Magnetic Materials

Volumn 226-230, Issue PART II, 2001, Pages 1618-1620

  Vaz, C A F ^a   Lauhoff, G ^a   Bland, J A C ^a   Fulthorpe, B D ^b   Hase, T P A ^b   Tanner, B K ^b   Langridge, S ^c   Penfold, J ^c  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b DURHAM UNIVERSITY   (United Kingdom)

^c RUTHERFORD APPLETON LABORATORY   (United Kingdom)

Author keywords

Magnetic moment saturation; Neutron reflection polarised; Stress internal; Thin films epitaxial; X ray diffraction

Indexed keywords

COERCIVE FORCE; MAGNETIC ANISOTROPY; MAGNETIC MOMENTS; MAGNETISM; MAGNETOMETERS; NEUTRON REFLECTION; NICKEL; STRAIN; THIN FILMS; ULTRATHIN FILMS; X RAY DIFFRACTION;

CAPPING THICKNESS; COERCIVE FIELD; GRAZING INCIDENCE; IN-PLANE STRAINS; MAGNETO-OPTIC KERR EFFECT; MOMENT SATURATION; PERPENDICULAR MAGNETIC ANISOTROPY; STRESS-INTERNAL;

COPPER;

EID: 33748707994     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-8853(01)00083-X     Document Type: Article

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