Magnetoresistive properties and microstructure of NiFe thin films and NiFe(t)/Cu(s)/NiFe(t) multilayer films

Thin Solid Films

Volumn 343-344, Issue 1-2, 1999, Pages 218-221

  Neamtu, Jenica ^a   Volmer, M ^b   Coraci, A ^a  

^a NATIONAL INSTITUTE FOR RESEARCH AND DEVELOPMENT IN MICROTECHNOLOGIES   (Romania)

^b TRANSILVANIA UNIVERSITY OF BRASOV   (Romania)

Author keywords

Atomic force microscopy; Electron scattering; Grain boundary; Magnetic measurement; Magnetic properties; Monolayer; Multilayer

Indexed keywords

ATOMIC FORCE MICROSCOPY; COPPER; CRYSTAL MICROSTRUCTURE; ELECTRON SCATTERING; GRAIN BOUNDARIES; MAGNETORESISTANCE; MONOLAYERS; MULTILAYERS; NICKEL COMPOUNDS;

GIANT MAGNETORESISTANCE (GMR); PERMALLOY MONOLAYERS;

MAGNETIC THIN FILMS;

EID: 0032676833     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(98)01629-0     Document Type: Article

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