Principle of π-phase plate long trace profiler for synchrotron radiation optics

Optics Communications

Volumn 200, Issue 1-6, 2001, Pages 23-26

  Zhao, Yang ^a   Li, Zhi ^b   Li, Dacheng ^b   Tiqiao, Xiao ^c   Shaojian, Xia ^c  

^a 1120 Science and Engineering Offices   (United States)

^b TSINGHUA UNIVERSITY   (China)

^c National Shanghai Synchrotron Radiation Center   (China)

Author keywords

Aspherical optics testing; Diffraction optics; Long trace profiler; Metrology for super large surface

Indexed keywords

ASPHERICS; DIFFRACTIVE OPTICS; LASER BEAMS; OPTICAL FIBERS; OPTICAL TESTING; SEMICONDUCTOR LASERS;

SYNCHROTRON RADIATION OPTICS;

SYNCHROTRON RADIATION;

EID: 0035893094     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0030-4018(01)01642-X     Document Type: Article

References (8)