Influence of surface morphology on the Si(100) and (111) ionization potentials

Physical Review B - Condensed Matter and Materials Physics

Volumn 64, Issue 19, 2001, Pages

  Sgiarovello, C ^a   Binggeli, N ^a   Baldereschi, A ^a  

^a INSTITUT ROMAND DE RECHERCHE NUMÉRIQUE EN PHYSIQUE DES MATÉRIAUX IRRMA   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON;

ADSORPTION; ANISOTROPY; ARTICLE; CATALYSIS; CRYSTALLOGRAPHY; ELECTRIC POTENTIAL; IONIZATION; SEMICONDUCTOR; SURFACE CHARGE;

EID: 0035891219     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.64.195305     Document Type: Article

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