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Volumn 359, Issue 1-3, 1996, Pages 155-162
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Study of the electronic structure of Si(100)2 × 1 and Cs/Si(100)2 × 1 with MIES and UPS (HeI)
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Author keywords
Alkali metals; Auger ejection; Electron emission; Ion solid interactions, scattering, channeling; Metal semiconductor interfaces; Metastable impact electron spectroscopies (MIES); Photoemission; Silicon; Visible and ultraviolet photoelectron spectroscopy
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Indexed keywords
ADSORPTION;
CESIUM ALLOYS;
CHARGE TRANSFER;
INTERFACES (MATERIALS);
IONS;
METALLIZING;
PHOTOELECTRON SPECTROSCOPY;
PHOTOEMISSION;
SCATTERING;
SILICON;
SIMULATION;
SURFACES;
AUGER EJECTION;
DANGLING BONDS;
ION SOLID CHANNELING;
ION SOLID INTERACTIONS;
METAL SEMICONDUCTOR INTERFACES;
METASTABLE IMPACT ELECTRON SPECTROSCOPIES;
ULTRAVIOLET PHOTOELECTRON SPECTROSCOPY;
VISIBLE PHOTOELECTRON SPECTROSCOPY;
ELECTRONIC STRUCTURE;
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EID: 0030196612
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/0039-6028(96)00363-9 Document Type: Article |
Times cited : (22)
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References (31)
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