Electron confinement in nickel and copper nanostructures on Cu(111)

Physical Review B - Condensed Matter and Materials Physics

Volumn 64, Issue 19, 2001, Pages

  Pons, Stéphane ^a   Mallet, Pierre ^a   Veuillen, Jean Yves ^a  

^a LABORATOIRE DE CRISTALLOGRAPHIE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; METAL; NICKEL;

ARTICLE; CHEMICAL ANALYSIS; CHEMICAL STRUCTURE; DISPERSION; ELECTRON; ELECTRONICS; LOW TEMPERATURE; MODEL; NANOPARTICLE; SCANNING TUNNELING MICROSCOPY; STRUCTURE ANALYSIS; TEMPERATURE;

EID: 0035891016     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.64.193408     Document Type: Article

References (28)

1. M F. Crommie and D M. Eigler, Nature (London)363, 524 (1993).
2. Y. Hasegawa and Ph. Avouris, Phys. Rev. Lett.71, 1071 (1993).
3. O. Jeandupeux, Phys. Rev. B59, 15 926 (1999).
4. L. Bürgi, Surf. Sci.447, L157 (2000).
5. P T. Sprunger, Science275, 1764 (1997).
6. L. Petersen, Phys. Rev. B57, R6858 (1998).
7. J. Li, Phys. Rev. Lett.81, 4464 (1998).
8. L. Bürgi, Phys. Rev. Lett.82, 4516 (1999).
9. Ph. Avouris and I W. Lyo, Science264, 942 (1994).
10. J. Li, R. Berndt, and S. Crampin, Phys. Rev. Lett.80, 3332 (1998).
11. J. Li, S. Crampin, and R. Berndt, Surf. Sci.422, 95 (1999).
12. L. Bürgi, Phys. Rev. Lett.81, 5370 (1998).
13. M F. Crommie and D M. Eigler, Science262, 218 (1993).
14. H C. Manoharan, C P. Lutz, and D M. Eigler, Nature (London)403, 512 (2000).
15. J. Kliewer, R. Berndt, and S. Crampin, Phys. Rev. Lett.85, 4936 (2000).
16. S D. Kevan, Phys. Rev. Lett.50, 526 (1983).
17. M. Donath, F. Passek, and V. Dose, Phys. Rev. Lett.70, 2802 (1993);
18. Phys. Rev. Lett.F. Passek and M. Donath, 71, 2122 (1993).
19. P. Mallet, Phys. Rev. B60, 2122 (1999).
20. J. De la Figuera, C. Ocal, and R. Miranda, Phys. Rev. B47,13 043 (1993).
21. M O. Pedersen, Surf. Sci.387, 86 (1997).
22. A. Brodde, Phys. Rev. B47, 6609 (1993).
23. H. Jenniches, H. Höche, and J. Kirschner, Appl. Phys. Lett.69, 3339 (1996).
24. L V. Pourovskii, et al., Surf. Sci.439, 111 (1999).
25. J. Tersoff and D R. Hamann, Phys. Rev. B31, 805 (1985);
26. Phys. Rev. BN D. Lang, 34, 5947 (1986).
27. J. Li, W D. Schneider, and R. Berndt, Phys. Rev. B56, 7656 (1997).
28. We plot E versus (formula presented) for a set of images such as in Fig. 33. For two couples of values (formula presented) and (formula presented) measured on the same island, with (formula presented) (formula presented), we have (formula presented). This gives a limited range of possible values for (formula presented) and (formula presented). The use of inner maxima only (discarting the ones closest to the edges) restricts the analysis to high energies (formula presented) in Fig. 33), but minimizes the distorsion between the LDOS and the conductance images that occur at low bias and close to step edges (Refs. 4 and 25).