Confocal scanning laser microscopy of polymer coatings

Journal of Applied Polymer Science

Volumn 67, Issue 1, 1998, Pages 149-158

  Ling, X ^a   Pritzker, M D ^a   Byerley, J J ^a   Burns, C M ^a  

^a UNIVERSITY OF WATERLOO   (Canada)

Author keywords

Coating; Confocal scanning laser microscopy; Electropolymerization; Morphology; Poly(2 vinylpyridine); Topography

Indexed keywords

CARBON STEEL; ELECTROPOLYMERIZATION; LASER APPLICATIONS; MICROSCOPIC EXAMINATION; MORPHOLOGY; NONDESTRUCTIVE EXAMINATION; OPACITY; SUBSTRATES; SURFACE MEASUREMENT; SURFACE ROUGHNESS; THICKNESS MEASUREMENT; VINYL RESINS;

CONFOCAL SCANNING LASER MICROSCOPY; POLYVINYLPYRIDINE; SURFACE TOPOGRAPHY;

PLASTIC COATINGS;

EID: 0032477472     PISSN: 00218995     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1097-4628(19980103)67:1<149::AID-APP17>3.0.CO;2-X     Document Type: Article

References (53)

1. S. J. Sheard and M. G. Somekh, Appl. Phys. Lett., 53, 2715 (1988).
2. S. K. Yang, V. V. Varadan, and V. K. Varadan, Mater. Eval., 48, 471 (1990).
3. B. Haworth and T. M. Robinson, Polym. Test., 10, 205 (1991).
4. A. Lewis and D. Bush, Mater. Eval., 49, 132 (1991).
5. S. M. Solov'ev, Meas. Tech., 34, 1122 (1991).
6. N. V. Edneral, A. V. Ivanov, G. N. Kosyak, and E. I. Fomicheva, Russ. J. Nondestr. Test., 29, 674 (1993).
7. V. Y. Silkin and A. E. Ponomarev, Meas. Tech., 36, 997 (1993).
8. V. Roessiger and P. Raffelsberger, Metal Finish., 90, 9 (1992).
9. T. Latter, Prod. Finish., 45, 15 (1994).
10. J. Montgomery, Mater. Eval., 52, 1354 (1994).
11. F. C. Reilly, Metal Finish., 92, 49 (1994).
12. H. Hong, D. Davidov, and R. Neumann, Adv. Mater., 7, 846 (1995).
13. X. P. Ling, J. J. Byerley, M. D. Pritzker, and C. M. Burns, J. Appl. Electrochem., in press.
14. G. Mengoli and B. M. Tidswell, Polymer., 16, 881 (1975).
15. F. S. Teng, R. Mahalingam, R. V. Subramanian, and R. A. V. Raff., J. Electrochem. Soc., 124, 995 (1977).
16. G. Mengoli and M. M. Musiani, J. Electrochem. Soc., 134, C643 (1987).
17. I. Sekine, K. Kohara, T. Sugiyama, and M. Yuasa, J. Electrochem. Soc., 139, 3090 (1992).
18. M. M. Musiani, F. Furlanetto, P. Guerriero, and J. Heitbaum, J. Appl. Electrochem., 23, 1069 (1993).
19. P. Denisevich, H. D. Abruna, C. R. Leidner, T. J. Meyer, and R. W. Murray, Inorg. Chem., 21, 2153 (1982).
20. R. L. McCarley, R. E. Thomas, E. A. Irene, and R. W. Murray, J. Electrochem. Soc., 137, 1485 (1990).
21. G. Mengoli, M. M. Musiani, and F. Furlanetto, J. Electrochem. Soc., 137, 162 (1990).
22. S. Taj, M. F. Ahmed, and S. Sankarapapavinasam, J. Appl. Electrochem., 23, 247 (1993).
23. A. de Bruyne, J. L. Delplancke, and R. Winand, J. Appl. Electrochem., 25, 284 (1995).
24. B. L. Funt, in Organic Electrochemistry, H. Lund and M. M. Baizer, Eds., Marcel Dekker, New York, 1991, p. 1337.
25. G. Mengoli, in Advances in Polymer Science, Vol. 33, Springer-Verlag, New York, 1979.
26. G. Mengoli and M. M. Musiani, Electrochim. Acta, 31, 201 (1986).
27. G. Odian, Principles of Polymerization, 3rd ed., McGraw-Hill, Toronto, 1991, Chap. 4.
28. C. M. Oatley, The Scanning Electron Microscope, Cambridge University Press, New York, 1972.
29. J. Wang, S. P. Chen, and M. S. Lin, J. Electroanal. Chem., 273, 231 (1989).
30. H. Ohno, H. Nishihara, and K. Aramaki, Corrosion Sci., 30, 603 (1990).
31. S. Arapapavinasam, J. Polym. Sci. Part A Polym. Chem., 31, 1105 (1993).
32. S. Kunimura, T. Ohsaka, and N. Oyama, Macromolecules, 21, 894 (1988).
33. T. Ohsaka, T. Hirokawa, H. Miyamoto, and N. Oyama, Anal. Chem., 59, 1758 (1987).
34. H. J. Guntberodt and R. Wiesendanger, Scanning Tunneling Microscopy I, Springer-Verlag, New York, 1992.
35. R. Wiesendanger and H. J. Guntherodt, Scanning Tunneling Microscopy II, Springer-Verlag, New York, 1992.
36. R. Wiesendanger and H. J. Guntherodt, Scanning Tunneling Microscopy III, Springer-Verlag, New York, 1993.
37. J. O'M. Bockris and S. U. M. Khan, Surface Electrochemistry, Plenum Press, New York, 1993, Chap.
38. N. J. DiNardo, Nanoscale Characterization of Surfaces and Interfaces, VCH, Weinheim, Germany,
39. M. J. Heben, R. M. Penner, N. S. Lewis, M. M. Dovek, and C. F. Quate, Appl. Phys. Lett., 54, 1421 (1989).
40. M. P. Everson and J. H. Helms, Synth. Metals, 40, 97 (1991).
41. J. P. Song, K. A. March, K. Carneiro, and A. R. Tholen, Surface Sci., 296, 299 (1993)
42. T. Ngo, L. Brandt, R. S. Eilliams, and H. D. Daesz, Surface Sci., 291, 411 (1993).
43. J. Z. Young and F. Roberts, Nature, 231, 167 (1951).
44. M. Minsky, U. S. Pat. 3,013,346 (1961).
45. P. Davidovita and D. M. Egger, Nature, 223, 831 (1969).
46. T. Wilson and C. Sheppard, Theory and Practic of Scanning Optical Microscopy, Academic Press, New York, 1984.
47. T. Wilson, Confocal Microscopy, Academic Press, New York, 1990.
48. A. E. Dixon, S. Damaskinos, M. R. Atkinson, and L. H. Cao, SPIE, 1556, 144 (1991).
49. A. E. Dixon, S. Damaskinos, and M. R. Atkinson, Nature, 351, 551 (1991).
50. X. P. Ling, Z. H. Gu, and T. Z. Fahidy, Electrochim. Acta, 40, 1789 (1995).
51. P. Phillips, L. D. Freedman, and J. C. Craig, Eds., Organic Electronic Spectral Data, Vol. 6, Wiley-Interscience, New York, 1970, p. 110.
52. R. C. Weast and M. J. Astle, Eds., CRC Handbook of Chemistry and Physics, 72nd ed., CRC Press, Boca Raton, FL, 1992.
53. R. L. Miller, in Polymer Handbook, J. Brandrup and E. H. Immergut, Eds., 3rd ed., Wiley, New York, 1989, Chap. 6.