Phase formation and characterization of the SrBi2Ta2O9 layered-perovskite ferroelectric

Integrated Ferroelectrics

Volumn 14, Issue 1-4, 1997, Pages 201-210

  Rodriguez, Mark A ^a   Boyle, Timothy J ^a   Buchheit, Catherine D ^a   Tissot, Raplh G ^a   Drewien, Celeste A ^a   Hernandez, Bernadette A ^a   Eatough, Michael O ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH COMPOUNDS; CRYSTALLIZATION; FERROELECTRIC MATERIALS; FILM PREPARATION; NONVOLATILE STORAGE; STRONTIUM COMPOUNDS; TANTALUM COMPOUNDS; X RAY DIFFRACTION ANALYSIS;

HIGH TEMPERATURE GRAZING INCIDENCE X RAY DIFFRACTION (HTGIXRD);

DIELECTRIC FILMS;

EID: 0031352164     PISSN: 10584587     EISSN: None     Source Type: Journal    
DOI: 10.1080/10584589708019993     Document Type: Article

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