Analysis of dark spots growing in organic EL devices by time-of-flight secondary ion mass spectrometry

Analytical Chemistry

Volumn 73, Issue 10, 2001, Pages 2245-2253

  Murase, A ^a   Ishii, M ^a   Tokito, S ^a   Taga, Y ^a  

^a Rd Management Section   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

GLASS SUBSTRATES;

CATHODES; DEPOSITION; INDIUM COMPOUNDS; MAGNESIUM PRINTING PLATES; OXIDATION; SECONDARY ION MASS SPECTROMETRY;

LUMINESCENT DEVICES;

ALUMINUM DERIVATIVE; ANILINE DERIVATIVE; INDIUM; MAGNESIUM; OXIDE; SILVER; TIN; TRIS(8 HYDROXYQUINOLINE)ALUMINUM; UNCLASSIFIED DRUG;

ANALYTIC METHOD; ARTICLE; CHEMICAL STRUCTURE; DEVICE; IMAGE ANALYSIS; LUMINESCENCE; MASS SPECTROMETRY; OXIDATION; STRUCTURE ANALYSIS;

EID: 0035872367     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac001087+     Document Type: Article

References (13)