Depth-resolved cathodoluminescence microanalysis of near-edge emission in III-nitride thin films

Journal of Applied Physics

Volumn 89, Issue 6, 2001, Pages 3535-3537

  Gelhausen, O ^a,c   Phillips, M R ^c   Toth, M ^b,c  

^a TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

^b UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^c UNIVERSITY OF TECHNOLOGY SYDNEY   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035868153     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1350619     Document Type: Article

References (12)

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