Electrical characterization of pn-junctions of PPV and silicon

Synthetic Metals

Volumn 121, Issue 1-3, 2001, Pages 1535-1536

  Stallinga, P ^a   Gomes, H L ^a   Charas, A ^b   Morgado, J ^b   Alcacer L ^b  

^a UNIVERSITY OF ALGARVE   (Portugal)

^b INSTITUTO SUPERIOR TÉCNICO   (Portugal)

Author keywords

Electrical measurements; Poly(phenylene vinylene); Semiconductor semiconductor interfaces

Indexed keywords

ACTIVATION ENERGY; CARRIER CONCENTRATION; DOPING (ADDITIVES); ELECTRIC VARIABLES MEASUREMENT; INTERFACES (MATERIALS); POLYMERS; SILICON;

POLYPHENYLENE VINYLENE;

SEMICONDUCTOR JUNCTIONS;

EID: 0035867402     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0379-6779(00)01174-7     Document Type: Article

References (5)

1. P. Stallinga, H. L. Gomes, H. Rost, A. B. Holmes, and R. H. Friend, to be published.
2. M. A. Green, J. Shewchun, Sol. Stat. Elec. 16 (1973) 1141, M. A. Green, J. Shewchun, J. Appl. Phys. 46 (1975) 5185.
3. M. A. Green, J. Shewchun, Sol. Stat. Elec. 16 (1973) 1141, M. A. Green, J. Shewchun, J. Appl. Phys. 46 (1975) 5185.
4. P. Stallinga, H. L. Gomes, G. W. Jones and D. M. Taylor, Synth. Met. 101 (1999) 496.
5. H. L. Gomes, P. Stallinga, H. Rost, A. B. Holmes, M. G. Harrison, and R. H. Friend., Appl. Phys. Lett. 74 (1999) 1144.