Electrical study of impurity states in conjugated polymers

Synthetic Metals

Volumn 101, Issue 1, 1999, Pages 496-497

  Stallinga, P ^a   Gomes, H L ^a   Jones, G W ^b   Taylor, D M ^b  

^a UNIVERSITY OF ALGARVE   (Portugal)

^b BANGOR UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; ANNEALING; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CONTACTS; ELECTRIC VARIABLES MEASUREMENT; ELECTRODEPOSITION; HOLE TRAPS; INTERFACES (MATERIALS); SCHOTTKY BARRIER DIODES; CAPACITANCE MEASUREMENT; ELECTRIC CURRENT MEASUREMENT; SPECTROSCOPIC ANALYSIS; SULFUR COMPOUNDS; THERMOPLASTICS; VOLTAGE MEASUREMENT;

ADMITTANCE SPECTROSCOPY; CAPACITANCE VOLTAGE MEASUREMENT; IMPURITY STATES; OPTICALLY INDUCED CURRENT TRANSIENTS; POLYMETHYLTHIOPHENE;

ORGANIC POLYMERS; CONDUCTIVE PLASTICS;

ADMITTANCE SPECTROSCOPY; POLYMETHYLTHIOPENES;

EID: 0032590772     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0379-6779(98)01292-2     Document Type: Article

References (4)

1. D.M. Taylor and H.L. Gomes, J. Phys. D 28, 2554 (1995).
2. P. Stallinga, H.L. Gomes, G.W. Jones and D.M. Taylor, submitted to Acta Physica Polonica (1998).
3. H.L. Gomes, thesis, University of Wales, Bangor (1993).
4. P. Blood and J.W. Orton, Techniques of Physics 14: The electrical characterization of semiconductors: majority carriers and electron states, Academic Press (1992).