High quality SiC applications in radiation dosimetry

Applied Surface Science

Volumn 184, Issue 1-4, 2001, Pages 425-430

  Bruzzi, M ^a   Nava, F ^b   Pini, S ^a,c   Russo, S ^c  

^a INFN SEZIONE DI FIRENZE   (Italy)

^b INFN SEZIONE DI BOLOGNA   (Italy)

^c CAREGGI UNIVERSITY HOSPITAL   (Italy)

Author keywords

Epitaxial; Irradiation; On line dosimeters; Silicon carbide

Indexed keywords

DOPING (ADDITIVES); DOSIMETRY; EPITAXIAL GROWTH; EPOXY RESINS; GAMMA RAYS; GOLD; OHMIC CONTACTS; SUBSTRATES;

ON-LINE DOSIMETERS;

SILICON CARBIDE;

EID: 0035852266     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(01)00528-1     Document Type: Article

References (16)

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