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Volumn 184, Issue 1-4, 2001, Pages 150-155

Spectroscopic ellipsometry analysis of nanocrystalline silicon carbide obtained at low temperature

Author keywords

Ellipsometry; Heterojunction diode; Nanocrystalline; Reactive sputtering; Silicon carbide

Indexed keywords

ELLIPSOMETRY; GRAIN SIZE AND SHAPE; LEAKAGE CURRENTS; LOW TEMPERATURE EFFECTS; MAGNETRON SPUTTERING; NANOSTRUCTURED MATERIALS; REFRACTIVE INDEX; SPECTROSCOPIC ANALYSIS; SUBSTRATES; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0035852199     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(01)00489-5     Document Type: Article
Times cited : (13)

References (24)
  • 19
    • 0000658152 scopus 로고
    • Demodulation and photodetection techniques
    • F.T. Arecchi, E.O. Schultz-Dubois (Eds.), North-Holland, Amsterdam
    • (1972) Laser Handbook , vol.1 , pp. 725
    • Melchior, H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.