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Volumn 474, Issue 3, 2001, Pages 259-272

Extreme ultraviolet (EUV) sources for lithography based on synchrotron radiation

Author keywords

Lithography; Radiation by moving charges; Synchrotron radiation

Indexed keywords

EXTREME ULTRAVIOLET (EUV) SOURCES;

EID: 0035846518     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(01)00887-7     Document Type: Article
Times cited : (26)

References (52)
  • 5
    • 0006765060 scopus 로고    scopus 로고
    • Progress in the development of extreme ultraviolet lithography
    • Y. Vladimirski (Ed.), Emerging Lithography Techniques III, Santa Clara
    • (1999) Proceedings of the SPIE , vol.3676
    • Stulen, R.H.1
  • 36
    • 84862718677 scopus 로고    scopus 로고
    • For an overview of worldwide FEL activities see
  • 37
    • 0000850706 scopus 로고    scopus 로고
    • Measurement of subpicosecond bunch profile using coherent transition radiation, talk given at seventh Beam Instrumentation Workshop (BIW 96)
    • Argonne, IL, 6-9 May 1996. Argonne
    • (1996) Proceedings of the Beam instrumentation , pp. 173-185
    • Barry, W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.