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Volumn 34, Issue 21, 2001, Pages 3121-3129

Sputtered lead scandium tantalate thin films: Crystallization behaviour during post-deposition annealing

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLIZATION; DIFFUSION; ENERGY DISPERSIVE SPECTROSCOPY; FERROELECTRICITY; MAGNETRON SPUTTERING; PYROELECTRICITY; RAPID THERMAL ANNEALING; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING LEAD COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

EID: 0035824101     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/34/21/304     Document Type: Article
Times cited : (14)

References (29)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.