Characterization of thin indium tin oxide films deposited by pulsed XeCl laser ablation

Journal of Physics D: Applied Physics

Volumn 34, Issue 17, 2001, Pages 2606-2609

  Martino, M ^a   Luches, A ^a   Fernandez M ^a   Anobile, P ^b   Petruzzelli V, ^b  

^a INFM   (Italy)

^b POLITECNICO DI BARI   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTIVITY; ELECTRODES; EXCIMER LASERS; INDIUM COMPOUNDS; LIGHT TRANSMISSION; OPTOELECTRONIC DEVICES; PULSED LASER DEPOSITION; SUBSTRATES;

PULSED EXCIMER LASER ABLATION; TRANSPARENT ELECTRODES;

ULTRATHIN FILMS;

EID: 0035822941     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/34/17/306     Document Type: Article

References (11)