Refraction contrast imaging with a scanning microlens

Applied Physics Letters

Volumn 78, Issue 23, 2001, Pages 3589-3591

  Fletcher, D A ^a   Crozier, K B ^a   Quate, C F ^a   Kino, G S ^a   Goodson, K E ^a   Simanovskii, D ^b   Palanker, D V ^b  

^a STANFORD UNIVERSITY   (United States)

^b STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035806193     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1377318     Document Type: Article

References (12)

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