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Volumn 400, Issue 1-2, 2001, Pages 154-159
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Spectroscopic and structural characterisation of a VOx (x≈1) ultrathin epitaxial film on Pt (111)
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Author keywords
Epitaxy; Growth; Photoelectron diffraction; Platinum; Vanadium oxide
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Indexed keywords
AUGER ELECTRON SPECTROSCOPY;
CRYSTAL STRUCTURE;
EPITAXIAL GROWTH;
EVAPORATION;
PLATINUM;
RELAXATION PROCESSES;
SCATTERING;
SINGLE CRYSTALS;
SUBSTRATES;
X RAY PHOTOELECTRON SPECTROSCOPY;
PHOTOELECTRON DIFFRACTION;
ULTRATHIN FILMS;
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EID: 0035803191
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/S0040-6090(01)01502-4 Document Type: Conference Paper |
Times cited : (8)
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References (22)
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