Ultrafast time-resolved transient structures of solids and liquids studied by means of X-ray diffraction and EXAFS

Journal of Physical Chemistry B

Volumn 103, Issue 34, 1999, Pages 7081-7091

  Tomov, Ivan V ^a   Oulianov, Dmitri A ^a   Chen, Peilin ^a,b   Rentzepis, Peter M ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0002059027     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp9908449     Document Type: Article

References (32)

1. Warren, B. E. X-ray Diffraction; Dover Publishers, Inc.: New York, 1990.
2. Koningsberger, D. C., Prins, R. Eds. X-ray Absorption; John Wiley & Sons: New York, 1988.
3. Elsayed-Ali, H. E.; Mourou, G. Appl. Phys. Lett. 1988, 52, 103.
4. Schafer, L.; Ewbank, J. D. Acta Chem. Scand. 1988, A42, 358.
5. Cao, J.; Ihee, I.; Zewail, A. H. Proc. Natl. Acad. Sci. U.S.A. 1999, 96, 338.
6. Ischencko, A. A.; Schafer, L.; Ewbank, J. D. J. Phys. Chem. A 1998, 102, 7329.
7. Schelev, M. Y.; Bryukhnevich, G. I.; Lozovoi, V. I.; Monastirski, M. A.; Proharov, A. M.; Smirnov, A. V.; Vorobiev, N. S. Opt. Eng. 1998, 37, 2249.
8. Geiser, J. D.; Weber, P. M. SPIE 1995, 2521, 136.
9. Liu, W. K.; Lin, S. H. Phys. Rev. A 1997, 55, 641.
10. Helliwell J. R., Rentzepis P. M., Eds. Time Resolved Diffraction; Oxford University Press: Oxford, 1997.
11. Raksi, F.; Wilson, K. R.; Jiang, Z.; Ikhlef, A.; Cote, C. Y.; Kieffer, J. C. J. Chem. Phys. 1996, 104, 6066.
12. Moffat, K.; Chen Y.; Ng K.; McRee D.; Getzoff E. D. Philos. Trans. R. Soc. London 1992, A340, 175.
13. Larson, B. C.; Tischler, J. Z.; Mills, D. M. J. Mater. Res. 1986, 1, 144.
14. Wark, J. S.; Whitlock, R. R.; Hauer, A. A.; Swain, J. E.; Solone, P. J. Phys. Rev. B 1989, 40, 5705.
15. Laesson, J.; Heimann, P. A.; Lindenberg, A. M.; Schuck, P. J.; Bucksbaum, P. H.; Lee, R. W.; Padmore, H. A.; Wark, J. S.; Falcone, R. W. Appl. Phys. A 1998, 66, 587.
16. Rentzepis, P. M., Ed. Time Resolved Electron and X-ray Diffraction; SPIE: Bellingham, WA, 1995; Vol. 2521.
17. Germer, R. J. Phys. E: Sci. Instrum. 1979, 12, 336.
18. Van Wonterghem, B.; Rentzepis, P. M. SPIE, 1990, 1204, 784.
19. Van Wonterghem, B.; Rentzepis, P. M. Laser Int. 1989, 89, 16.
20. Tomov, I. V.; Anderson, T.; Rentzepis, P. M. J. X-ray Sci. Technol. 1993, 4, 44.
21. Tomov, I. V.; Chen P.; Rentzepis, P. M. J. Appl. Phys. 1998, 83, 5546.
22. Zachariasen, W. H. Theory of X-ray Diffraction in Crystals; Wiley: New York, 1945.
23. Taupin, D. Bull. Soc. Fr. Miner. Cryst. 1964, 87, 469.
24. Wie, C. R.; Tombrello, T. A.; Vreeeland, T., Jr. J. Appl. Phys. 1986, 59, 3743.
25. Chen, P.; Tomov, I. V.; Rentzepis, P. M. J. Chem. Phys. 1996, 104, 10001.
26. Bechtel, J. H. J. Appl. Phys., 1975, 46, 1585.
27. Fukuhara, A.; Takano, Y. Acta Crystallogr. A 1977, 33, 137.
28. Tomov, I. V.; Chen P.; Rentzepis P. M. Rev. Sci. Instrum. 1995, 66, 5214.
29. Chen, P.; Tomov, I. V.; Rentzepis, P. M. J. Phys. Chem. A, 1999, 103, 2359.
30. Solis, J.; Afonso, C. N.; Piqueras, J. J. Appl. Phys. 1992, 71, 1032.
31. Chen, P.; Tomov, I. V.; Rentzepis, P. M. J. Appl. Chryst. 1999, 32, 82.
32. Medea, H.; Terauchi, H.; Tanabe, K.; Kamijo, N.; Hida, M.; Kawamura, H. Jpn. J. Appl. Phys. 1982, 21, 1342.