SCOPUS 정보 검색 플랫폼

Advanced Materials

Volumn 13, Issue 5, 2001, Pages 310-313

Force modulation atomic force microscopy as a powerful tool in organic-inorganic hybrid materials analysis

(4) Schiavon, G d Kuchler, J G c Corain, B b Hiller, W a

a TECHNICAL UNIVERSITY OF MUNICH (Germany)

b Colfirmit Rajasil GmbH ^* (Germany)

c UNIVERSITY OF PADOVA (Italy)

d Centro per lo Studio della Stabilita e Reattivita dei Composti di Coordinazione (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DEPOSITION; FILM PREPARATION; HARDNESS; PHASE SEPARATION; SURFACE PROPERTIES;

FORCE MODULATION ATOMIC FORCE MICROSCOPY;

SOL-GELS;

EID: 0035793770 PISSN: 09359648 EISSN: None Source Type: Journal
DOI: 10.1002/1521-4095(200103)13:5<310::AID-ADMA310>3.0.CO;2-C Document Type: Article

Times cited : (6)

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