Time-resolved x-ray diffraction study of ultrafast acoustic phonon dynamics in Ge/Si-heterostructures

Springer Series in Chemical Physics

Volumn 66, Issue , 2001, Pages 281-283

  Sokolowski Tinten, K ^a   Cavalleri, A ^b   Siders, C W ^b,c   Brown, F L H ^b   Leitner, D M ^b,d   Toth, C ^b   Kammler, M ^e   Horn von Hoegen, M ^a   Von der Linde, D ^a   Squier, J A ^b   Barty, C P J ^b   Wilson, K R ^b  

^a UNIVERSITY OF DUISBURG ESSEN   (Germany)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c UNIVERSITY OF CENTRAL FLORIDA   (United States)

^d UNIVERSITY OF NEVADA   (United States)

^e LEIBNIZ UNIVERSITY HANNOVER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTICS; CONFERENCE PAPER; CRYSTALLIZATION; MOLECULAR DYNAMICS; RADIATION SCATTERING; SEMICONDUCTOR; STRAIN DIFFERENCE; TEMPERATURE DEPENDENCE; X RAY DIFFRACTION;

EID: 0035775856     PISSN: 01726218     EISSN: None     Source Type: Journal    
DOI: 10.1007/978-3-642-56546-5_81     Document Type: Article

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