Diffraction-limited microbeam with Fresnel zone plate optics in hard X-ray regions

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4499, Issue , 2001, Pages 74-84

  Suzuki, Yoshio ^a   Takeuchi, Akihisa ^a   Takano, Hidekazu ^a   Ohigashi, Takuji ^b   Takenaka, Hisataka ^c  

^a Institute of Physical and Chemical Research   (Japan)

^b UNIVERSITY OF TSUKUBA   (Japan)

^c NTT Advanced Technology Corporation   (Japan)

Author keywords

Fresnel zone plate; Undulator; X ray microbeam; X ray microscopy

Indexed keywords

DIFFRACTION; ELECTRON BEAM LITHOGRAPHY; FOCUSING; LIGHT MODULATION; NUMERICAL METHODS; OPTICAL SYSTEMS; OPTICAL TRANSFER FUNCTION; SCANNING ELECTRON MICROSCOPY; STORAGE RINGS; TANTALUM;

BEAM FOCUSING DEVICE; FRESNEL ZONE PLATE OPTICS; HARD X RAY; SCANNING MICROSCOPY; X RAY MICROBEAM; X-RAY ENERGY;

X RAY OPTICS;

EID: 0035767999     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.450224     Document Type: Article

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