Novel integrating solid state detector with segmentation for scanning transmission soft x-ray microscopy

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4499, Issue , 2001, Pages 117-125

  Feser, Michael ^a   Jacobsen, Chris ^a   Rehak, Pavel ^b   Degeronimo, Gianluigi ^b   Holl, Peter ^c   Strüder, Lothar ^d  

^a STONY BROOK UNIVERSITY   (United States)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

^c KETEK GMBH   (Germany)

^d MAX PLANCK INSTITUT FÜR EXTRATERRESTRISCHE PHYSIK   (Germany)

Author keywords

Soft x ray detectors; X ray microscopy

Indexed keywords

DIFFRACTION; FOCUSING; NUMERICAL METHODS; OPTICAL MICROSCOPY; PHOTONS; SCANNING; SHOT NOISE; SILICON SENSORS; SOLID STATE DEVICES; STATISTICAL METHODS;

SCANNING TRANSMISSION SOFT X RAY MICROSCOPY; SOFT X RAY DETECTOR; SOLID STATE DETECTOR; X RAY MICROSCOPY;

X RAY MICROSCOPES;

EID: 0035765702     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.450229     Document Type: Article

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