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Volumn 4501, Issue , 2001, Pages 54-62

Surface quality of x-ray mirrors evaluated at the advanced photon source

Author keywords

Metrology; Roughness; Slope error; Surface figure; Surface slope error; Synchrotron radiation; X ray mirrors

Indexed keywords

MEASUREMENT ERRORS; MIRRORS; PROFILOMETRY; SURFACE ROUGHNESS; SYNCHROTRON RADIATION;

EID: 0035765664     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.448498     Document Type: Conference Paper
Times cited : (4)

References (10)
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    • 0001584829 scopus 로고    scopus 로고
    • Elliptical X-ray microprobe mirrors by differential deposition
    • Gene E. Ice, Jin-Seok Chung, John Tischler, Andrew Lunt, Lahsen Assoufid, "Elliptical X-ray Microprobe Mirrors by Differential Deposition," Rev. Sci. Intrum. 71 (7), 2635 (2000).
    • (2000) Rev. Sci. Intrum. , vol.71 , Issue.7 , pp. 2635
    • Ice, G.E.1    Chung, J.-S.2    Tischler, J.3    Lunt, A.4    Assoufid, L.5
  • 2
    • 0022062246 scopus 로고
    • Direct comparison of mechanical and optical profiler measurements of the finish and precision machined optical surfaces
    • E.L. Church, T.V. Vorburger, J. Wyant, "Direct comparison of mechanical and optical profiler measurements of the finish and precision machined optical surfaces," Optical Engineering, Vol. 24 No 3, (1985), 388-395.
    • (1985) Optical Engineering , vol.24 , Issue.3 , pp. 388-395
    • Church, E.L.1    Vorburger, T.V.2    Wyant, J.3
  • 4
    • 0038800777 scopus 로고    scopus 로고
    • Long trace profiler measurement repeatability improvements
    • Peter Z. Takacs, Eugene L. Church, Cynthia Bresloff, and Lahsen Assoufid, "Long Trace Profiler Measurement Repeatability Improvements," Appl. Optics, Vol. 38, No. 25, 5468-5479 (1999).
    • (1999) Appl. Optics , vol.38 , Issue.25 , pp. 5468-5479
    • Takacs, P.Z.1    Church, E.L.2    Bresloff, C.3    Assoufid, L.4
  • 6
    • 77956978378 scopus 로고
    • Phase-measurement interferometry techniques
    • Edt. E. Wolf, Elsevier Science Publisher B.V.
    • Katherine Creath, "Phase-Measurement Interferometry Techniques," Progress in Optics XXVI, Edt. E. Wolf, Elsevier Science Publisher B.V., 349-398 (1988).
    • (1988) Progress in Optics XXVI , pp. 349-398
    • Creath, K.1
  • 7
    • 0023458214 scopus 로고
    • M400 - A coordinate measuring machine with 10 nm resolution
    • Becker, K., and Heynacher, E., "M400 - A coordinate measuring machine with 10 nm resolution," SPIE Vol. 802, 209-216 (1987).
    • (1987) SPIE , vol.802 , pp. 209-216
    • Becker, K.1    Heynacher, E.2
  • 8
    • 0010940980 scopus 로고    scopus 로고
    • Vertically focusing mirror commissioning on the 1-BM beamline
    • SRI-CAT
    • G. Srajer, et al., Vertically focusing mirror commissioning on the 1-BM beamline, SRI-CAT, 1998.
    • (1998)
    • Srajer, G.1
  • 9
    • 0032224658 scopus 로고    scopus 로고
    • Metrology of a mirror at the advanced source: Comparison between optical and x-ray measurements
    • Lahsen Assoufid, Jonathan Lang, Jin Wang, George Srajer, "Metrology of a mirror at the Advanced Source: comparison between optical and x-ray measurements," SPIE Vol. 3447, 106-116, (1998).
    • (1998) SPIE , vol.3447 , pp. 106-116
    • Assoufid, L.1    Lang, J.2    Wang, J.3    Srajer, G.4
  • 10
    • 0010813543 scopus 로고    scopus 로고
    • Measurement of the vertically focused beam profile at 9-ID
    • C. Venkataraman, D.M. Casa, Thomas Gog, "Measurement of the Vertically Focused Beam Profile at 9-ID", www.cmc.aps.anl.gov/techniques/notes/Beam_Profile_1/Beam_Profile_1.html, (2001).
    • (2001)
    • Venkataraman, C.1    Casa, D.M.2    Gog, T.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.