Dynamic and lifetime measurements of polymer OFETs and integrated plastic circuits

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4466, Issue , 2001, Pages 95-102

  Ficker, Jürgen ^a   Ullmann, Andreas ^a   Fix, Walter ^a   Rost, Henning ^a   Clemens, Wolfgang ^a  

^a SIEMENS AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

FIELD EFFECT TRANSISTORS; FLIP FLOP CIRCUITS; GATES (TRANSISTOR); MODULATION; POLYMERS; SUBSTRATES;

INTEGRATED PLASTIC CIRCUITS (IPC);

SEMICONDUCTING ORGANIC COMPOUNDS;

EID: 0035765523     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.451471     Document Type: Conference Paper

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