Target identification performance as a function of spurious response: Aliasing with respect to the half sample rate

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4372, Issue , 2001, Pages 51-61

  Moyer, Steve ^a   Driggers, Ronald G ^a   Vollmerhausen, Rich ^a   Krapels, Keith ^a  

^a NIGHT VISION AND ELECTRONIC SENSORS DIRECTORATE   (United States)

Author keywords

Electro Optics Performance Modeling; Sampling; Target Acquisition

Indexed keywords

DATA ACQUISITION; ELECTROOPTICAL EFFECTS; FREQUENCY DOMAIN ANALYSIS; IMAGE RECONSTRUCTION; IMAGE SENSORS; SAMPLING;

TARGET ACQUISITION;

INFRARED IMAGING;

EID: 0035758781     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.439161     Document Type: Conference Paper

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