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Volumn 29, Issue 1, 1982, Pages 41-50
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The definition of the OTF and the measurement of aliasing for sampled imaging systems
a b c d
d
TNO
(Netherlands)
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 84950881099
PISSN: 00303909
EISSN: None
Source Type: Journal
DOI: 10.1080/713820741 Document Type: Article |
Times cited : (91)
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References (9)
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