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Volumn , Issue , 2001, Pages 725-728
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Current status and prospects of ferroelectric memories
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Author keywords
[No Author keywords available]
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Indexed keywords
CMOS INTEGRATED CIRCUITS;
CRYSTALLIZATION;
ELECTRIC POTENTIAL;
FERROELECTRIC MATERIALS;
FERROELECTRIC THIN FILMS;
GATES (TRANSISTOR);
INTEGRATED CIRCUIT MANUFACTURE;
LOGIC CIRCUITS;
SEMICONDUCTOR DEVICE MANUFACTURE;
CELL STRUCTURES;
CRYSTALLIZATION ANNEALING;
DATA RETENTION;
FERROELECTRIC RANDOM ACCESS MEMORIES;
NON-DESTRUCTIVE READOUT TYPE CELLS;
RANDOM ACCESS STORAGE;
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EID: 0035716696
PISSN: 01631918
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (2)
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References (7)
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