Beam diagnostics by Thomson scattering with the Tokyo-EBIT

Physica Scripta T

Volumn 92, Issue , 2001, Pages 351-353

  Kuramoto, H ^a   Yamada, I ^a   Watanabe, H ^a   Sawasaki, M ^a   Yamada, C ^a   Ohtani, S ^a  

^a Japan Science and Technology Agency   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON SCATTERING; ELECTRON TRAPS; ION BEAMS; MAGNETIC FIELD EFFECTS;

ELECTRON BEAM ION TRAPS (EBIT); THOMSON SCATTERING;

ELECTRON BEAMS;

EID: 0035716347     PISSN: 02811847     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)