On the measurement of electron impact ionisation cross-sections for highly charged ions using an electron beam ion trap (EBIT)

Physica Scripta T

Volumn 80, Issue B, 1999, Pages 289-291

  Sokell, E ^a   Currell, F J ^a,b   Shimizu, H ^a   Ohtani, S ^a,b  

^a UNIVERSITY OF ELECTRO COMMUNICATIONS   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0002916554     PISSN: 02811847     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (8)

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