Field emission property of Al:ZnO whiskers modified by amorphous carbon and related films

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 40, Issue 12, 2001, Pages 7013-7017

  Ohkawara, Yoshiaki ^a   Naijo, Takanori ^a   Washio, Tsukasa ^a   Ohshio, Shigeo ^a   Ito, Haruhiko ^a   Saitoh, Hidetoshi ^a  

^a NAGAOKA UNIVERSITY OF TECHNOLOGY   (Japan)

Author keywords

Carbon nitride; CVD; ERDA; Field emission; IR spectroscopy; Nanoindentation; Raman scattering spectroscopy; Whiskers; ZnO

Indexed keywords

AGGLOMERATION; AMORPHOUS FILMS; CARBON; CHEMICAL MODIFICATION; CHEMICAL VAPOR DEPOSITION; CRYSTAL STRUCTURE; ELECTRIC CONDUCTIVITY; FIELD EMISSION DISPLAYS; INFRARED SPECTROSCOPY; RAMAN SPECTROSCOPY; SYNTHESIS (CHEMICAL); ZINC OXIDE;

AMORPHOUS CARBON; ELECTRON AFFINITY; FIELD EMISSION PROPERTY; TERMINATION STRUCTURE;

CRYSTAL WHISKERS;

EID: 0035713452     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.40.7013     Document Type: Article

References (14)