Sensitivity of R s-measurement of HTS thin films by three prime resonant techniques: Cavity resonator, dielectric resonator, and microstrip resonator

IEEE Transactions on Applied Superconductivity

Volumn 11, Issue 4, 2001, Pages 4128-4135

  Misra, Mukul ^b   Kataria, Narayan D ^c   Pinto, R ^d   Tonouchi, Masayoshi ^b   Srivastava, G P ^a,e  

^a IEEE   (India)

^b OSAKA UNIVERSITY   (Japan)

^c NATIONAL PHYSICAL LABORATORY   (India)

^d TATA INSTITUTE OF FUNDAMENTAL RESEARCH   (India)

^e UNIVERSITY OF DELHI   (India)

Author keywords

HTS resonators; HTS thin film; Measurement techniques; Microwave surface resistance

Indexed keywords

MICROSTRIP RESONATORS;

CAVITY RESONATORS; DIELECTRIC MATERIALS; HIGH TEMPERATURE SUPERCONDUCTORS; MICROSTRIP DEVICES; SENSITIVITY ANALYSIS; SUPERCONDUCTING TRANSITION TEMPERATURE; THIN FILMS;

SUPERCONDUCTING FILMS;

EID: 0035704554     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.979855     Document Type: Article

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