Investigating high-tc superconductors-a cryogenic microwave broad-band calibration

IEEE Transactions on Microwave Theory and Techniques

Volumn 48, Issue 7 PART 2, 2000, Pages 1286-1289

  Reuss, T ^a   Richard, J ^a  

^a CNRS   (France)

Author keywords

Conductivity measurement; Cryogenics; Frequency response; High temperature superconductors; Impedance; Microwave measurements; Microwave reflectometry; Thin films

Indexed keywords

MICROWAVE REFLECTOMETRY; OPEN SHORT LOAD BROADBAND CALIBRATION;

COMPUTER SIMULATION; CRYOGENICS; ELECTRIC CONDUCTIVITY MEASUREMENT; ELECTRIC IMPEDANCE MEASUREMENT; ELECTRIC NETWORK ANALYZERS; FREQUENCY RESPONSE; HIGH TEMPERATURE SUPERCONDUCTORS; MICROWAVE CIRCUITS; THIN FILMS;

MICROWAVE MEASUREMENT;

EID: 0034224818     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/22.853475     Document Type: Article

References (9)

1. J. R. Clem and M. W. Coffey, "Unified theory of effects of vortex pinning and flux creep upon the RF surface impedance of type-II superconductors," Phys. Rev. Lett., vol. 67, no. 3, pp. 386-389, July 1991.
2. D. S. Fisher, M. P. A. Fisher, and D. A. Huse, "Thermal fluctuations, quenched disorder, phase transitions, and transport in type-II-superconductors," Phys. Rev. B, Condens. Matter, vol. 43, no. 1, pp. 130-159, Jan. 1991.
3. M. Golosovsky, D. Davidov, E. Farber, T. Tsach, and M. Schieber, "Microwave transmission and harmonic generation in granular high-Tc superconducting films: Evidence for flux motion and weak links," Phys. Rev. B, Condens. Matter, vol. 43, pp. 10390-10398, May 1991.
4. P. Xavier, "Etude de la response hyperfréquence des vortex dans des couches minces supraconductrices àhaute température critique," Ph.D. dissertation, Dept. Phys., Université Joseph Fourier, Grenoble, France, 1994.
5. J. C. Booth, D. H. Wu, and S. M. Anlage, "A broadband method for the measurement of the surface impedance of thin films at microwave frequencies," Rev. Sei. Instrum., vol. 65, no. 6, pp. 2082-2090, June 1994.
6. B. Oldfield, "The connector interface and its effect on calibration accuracy," Microwave J., pp. 106-114, Mar. 1996.
7. B. Yates, R. F. Cooper, and A. F. Pojur, "Thermal expansion at elevated temperatures: II. Aluminum oxide: Experimental data between 100 and 800 K and their analysis," J. Phys. C, Solid State Phys., vol. 5, pp. 1046-1058, 1972.
8. R. Shelby, J. Fontanella, and C. Andeen, "The low temperature electrical properties of some anisytropic crystals," J. Phys. Chem. Solids, vol. 41, pp. 69-74, 1979.
9. J. Krupka, R. G. Geyer, M. Kühn, and J. H. Hinken, "Dielectric properties of single crystals of A12 O3, LaAlO3, NdGaO3, SrTiO3 and MgO at cryogenic temperatures," IEEE Trans. Microwave Theory Tech., vol. 42, pp. 1886-1890, Oct. 1994.