Analysis of sensitivity of microwave surface resistance measurement of HTS thin films using dielectric resonator with finite shield

Electronics Letters

Volumn 35, Issue 20, 1999, Pages 1779-1780

  Misra, Mukul ^a   Kataria, N D ^a   Srivastava, G P ^b  

^a NATIONAL PHYSICAL LABORATORY   (India)

^b UNIVERSITY OF DELHI   (India)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC SHIELDING; HIGH TEMPERATURE SUPERCONDUCTORS; NUMERICAL METHODS; Q FACTOR MEASUREMENT; RESONATORS; SURFACE MEASUREMENT; SURFACE PROPERTIES;

DIELECTRIC RESONATOR; FINITE SHIELD; HIGH TEMPERATURE SUPERCONDUCTOR THIN FILMS; MICROWAVE SURFACE RESISTANCE;

THIN FILMS;

EID: 0033193418     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:19991174     Document Type: Article

References (4)

1. KRUPKA, J., KLINGER, M., KUHN, M., BARANYAK, A., STELLER, M., HINKEN, J., and MODELSKI, J.: 'Surface resistance measurements of HTS films by means of sapphire dielectric resonators', IEEE Trans. Appl. Supercond., 1993, 3, pp. 3043-3048
2. c superconductors'. IEEE Trans. Microw. Theory Tech., 1991, 39, pp. 1530-1538
3. c superconictor-sapphire microwave resonator with extremely high Q-value up to 90 K', IEEE Trans. Microw. Theory Tech., 1992, 40, pp. 2424-2432
4. MISRA, M.: 'Microwave characterisation of high temperature superconductors by resonant techniques'. PhD Thesis, 1999, University of Delhi, New Delhi, India