Benefits of phase interference detection to IC waveform probing

Proceedings of the Asian Test Symposium

Volumn , Issue , 2001, Pages 185-190

  Block, Jeffrey A ^a   Lo, William K ^a   Shaw, Chris ^a  

^a SCHLUMBERGER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; LASER APPLICATIONS; SIGNAL INTERFERENCE; WAVEFORM ANALYSIS;

AMPLITUDE DETECTION; BACKSIDE LASER PROBING; PHASE INTERFERENCE DETECTION; PROBE PLACEMENT; SIGNAL QUALITY;

FLIP FLOP CIRCUITS;

EID: 0035699318     PISSN: 10817735     EISSN: None     Source Type: Journal    
DOI: 10.1109/ATS.2001.990279     Document Type: Article

References (9)

1. Optical probing of flip chip packaged microprocessors
2. Novel optical probing technique for flip chip packaged microprocessors
3. Waveform acquisition from the backside of silicon using electro-optic probing
4. Optical probing of VLSI IC's from the silicon backside
5. Optical probing of flip-chip packaged microprocessors
6. Practical optical waveform probing of flip-chip CMOS devices
7. Integrated circuit waveform probing using optical phase shift detection
8. Optical interferometric probing of advanced microprocessors