Intrinsic noise currents in deep submicron MOSFETs

IEEE MTT-S International Microwave Symposium Digest

Volumn 2, Issue , 2001, Pages 835-838

  Chen, Chih Hung ^a   Deen, M Jamal ^a   Cheng, Yuhua ^a   Matloubian, Mishel ^a  

^a MCMASTER UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC VARIABLES MEASUREMENT; EQUIVALENT CIRCUITS; INTEGRATED CIRCUIT MANUFACTURE; MATHEMATICAL MODELS; SCATTERING PARAMETERS; THERMAL NOISE;

CHANNEL THERMAL NOISE; DEEP SUBMICRON MOSFETS; INDUCED GATE NOISE; INTRINSIC NOISE CURRENTS;

MOSFET DEVICES;

EID: 0035689698     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)

1. Solid-state circuits