A method to compare vector nonlinear network analyzers

IEEE MTT-S International Microwave Symposium Digest

Volumn 1, Issue , 2001, Pages 1667-1670

  Remley, Kate A ^a   DeGroot, Donald C ^a   Jargon, Jeffrey A ^a   Gupta, K C ^b  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b University of Colorado at Boulder   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC IMPEDANCE; SPURIOUS SIGNAL NOISE; VECTORS; WAVEFORM ANALYSIS;

MULTIHARMONIC WAVEFORM; VECTOR NONLINEAR NETWORK ANALYZERS;

ELECTRIC NETWORK ANALYZERS;

EID: 0035689611     PISSN: 0149645X     EISSN: None     Source Type: Journal    
DOI: 10.1109/MWSYM.2001.967225     Document Type: Article

References (9)

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5. A method for comparing vector network analyzers
6. Characterizing high-speed oscilloscopes
7. Individual characterization of broadband sampling oscilloscopes with a nose-to-nose calibration procedure
8. Accurately characterizing hard nonlinear behavior of microwave components with the nonlinear network measurement system: Introducing 'Nonlinear scattering functions'
9. Easy and accurate empirical transistor model parameter estimation from vectorial large-signal measurements