On-wafer large signal power, S-parameter and waveform measurement system

International Workshop on Integrated Nonlinear Microwave and Millimeterwave Circuits

Volumn , Issue , 1994, Pages 153-158

  Demmler, M ^a   Tasker, P J ^a   Schlechtweg, M ^a  

^a FRAUNHOFER INSTITUTE FOR APPLIED SOLID STATE PHYSICS IAF   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; COMPUTER AIDED DESIGN; ELECTRIC CURRENTS; HARMONIC ANALYSIS; MONOLITHIC MICROWAVE INTEGRATED CIRCUITS; OPTIMIZATION; TERMINALS (ELECTRIC); TRANSISTORS; VECTORS; WAVEFORM ANALYSIS;

LARGE SIGNAL MEASUREMENT; MICROWAVE TRANSITION ANALYZERS; ON WAFER MEASUREMENT; S PARAMETER MEASUREMENT;

ELECTRIC VARIABLES MEASUREMENT;

EID: 0028740289     PISSN: 09388028     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)