Integrated electro-thermal probe

IEEE MTT-S International Microwave Symposium Digest

Volumn 1, Issue , 2001, Pages 1523-1526

  Reano, Ronald M ^a   Yang, Kyoung ^a   Whitaker, John F ^a   Katehi, Linda P B ^a  

^a University of Michigan   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURVE FITTING; ELECTRIC FIELD MEASUREMENT; LINEARIZATION; MONOLITHIC MICROWAVE INTEGRATED CIRCUITS; OPTICAL RESOLVING POWER; PHOTONS; PROBES; SEMICONDUCTING GALLIUM ARSENIDE; TEMPERATURE MEASUREMENT; THERMAL EFFECTS; THERMISTORS;

ELECTROTHERMAL PROBE; PHOTON ABSORPTION; POCKELS EFFECT; THERMAL FIELDS MEASUREMENT;

ELECTROOPTICAL DEVICES;

EID: 0035686239     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)

1. Electro-thermal modeling and measurement for spatial power combining at millimeter wavelengths
2. An integrated environment for the simulation of electrical, thermal and electromagnetic interactions in high-performance integrated circuits
3. A physics-based electro-thermal model for microwave and millimeter wave HEMTs
4. A 120-W X-band spatially combined solid-state amplifier
5. A 4 Watt Ka-band quasi-optical amplifier
6. Electro-optic field mapping system utilizing external gallium arsenide probes
7. Novel electromagnetic field probe using electro/magneto-optical crystals mounted on optical-fiber facets for microwave circuit diagnostics
8. Temperature dependence of the optical absorption edge in indium phosphide
9. The standard thermodynamic functions for the formation of electrons and holes in Ge, Si, GaAs and GaP
10. Concentration dependence of the absorption coefficient for n- and p-type GaAs between 1.3 and 1.6 eV
11. Electric-field mapping system using an optical-fiber-based electro-optic probe