A general purpose 1149.4 IC with HF analog test capabilities

IEEE International Test Conference (TC)

Volumn , Issue , 2001, Pages 38-45

  Sunter, Stephen ^a   Filliter, Ken ^b   Woo, Joe ^c   McHugh, Pat ^b  

^a LogicVision Inc   (United States)

^b NATIONAL SEMICONDUCTOR CORPORATION   (United States)

^c LockheedM artin EPI ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SOFTWARE; DESIGN FOR TESTABILITY; ELECTRIC IMPEDANCE; PRINTED CIRCUIT BOARDS;

MIXED-SIGNAL CIRCUIT BOARDS;

INTEGRATED CIRCUIT TESTING;

EID: 0035684207     PISSN: 10893539     EISSN: None     Source Type: Journal    
DOI: 10.1109/TEST.2001.966616     Document Type: Article

References (10)

1. A demonstration IC for the P1149.4 mixed-signal test standard
2. Control and observation of analog nodes in mixed-signal boards
3. A 100 MHz low cost analog test bus
4. The alias theorems: Practical undersampling for expert engineers
5. Analog DFT using an undersampling technique