A highly-efficient transparent online memory test

IEEE International Test Conference (TC)

Volumn , Issue , 2001, Pages 230-239

  Thaller, Karl ^a  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTER HARDWARE; DECODING; ELECTRONIC EQUIPMENT TESTING; ONLINE SYSTEMS;

HAMMING CODE PROTECTION; TRANSPARENT ONLINE MEMORY TEST (TOMT);

DATA STORAGE EQUIPMENT;

EID: 0035681189     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)

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9. Efficient UBIST for RAMs
10. An open notation for memory tests
11. VLSI implementation of a self-checking self-exercising memory system
12. Open defects in CMOS RAM address decoders
13. On the necessity of on-line-BIST in safety-critical applications - A case-study