Study of quadrupole-octopole Cc corrector for the large gap HREM

Optik (Jena)

Volumn 112, Issue 11, 2001, Pages 521-530

  Xiu, Kai ^a   Gibson, Murray ^a  

^a University of Illinois at Urbana Champaign   (United States)

Author keywords

Chromatic aberration; Electron optics; High resolution TEM; Octopole; Quadrupole

Indexed keywords

ABERRATIONS; ELECTRIC FIELD EFFECTS; ELECTRIC POTENTIAL; ELECTRODES; ELECTROSTATIC LENSES; HIGH RESOLUTION ELECTRON MICROSCOPY; OPTICAL RESOLVING POWER;

CHROMATIC ABERRATIONS; QUADRUPOLE-OCTOPOLE CORRECTORS;

ELECTRON OPTICS;

EID: 0035680339     PISSN: 00304026     EISSN: None     Source Type: Journal    
DOI: 10.1078/0030-4026-00095     Document Type: Article

References (5)

1. Towards sub-Å electron beams
2. A spherical-aberration-corrected 200 kV transmission electron microscope
3. Design of a high-resolution low-voltage scanning electron microscope