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Volumn 308-310, Issue , 2001, Pages 924-927
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Investigation of the defect structure in Cd1-xZnxTe by positron lifetime spectroscopy
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Author keywords
Cadmium zinc telluride; Defects; Positron annihilation spectroscopy
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Indexed keywords
CRYSTAL GROWTH;
ELECTRIC CONDUCTIVITY;
POSITRON ANNIHILATION SPECTROSCOPY;
SEMICONDUCTING CADMIUM COMPOUNDS;
POSITRON LIFETIME SPECTROSCOPY (PLS);
CRYSTAL DEFECTS;
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EID: 0035675024
PISSN: 09214526
EISSN: None
Source Type: Journal
DOI: 10.1016/S0921-4526(01)00852-3 Document Type: Article |
Times cited : (8)
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References (12)
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