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Volumn 197, Issue 3, 1999, Pages 581-585

Point defect characterization of Zn- and Cd-based semiconductors using positron lifetime spectroscopy

Author keywords

II VI compounds; Point defects; Positron annihilation spectroscopy

Indexed keywords

SEMICONDUCTING CADMIUM TELLURIDE; SEMICONDUCTING ZINC COMPOUNDS; SEMICONDUCTOR GROWTH; SPECTROSCOPIC ANALYSIS;

EID: 0033514234     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(98)00960-9     Document Type: Article
Times cited : (19)

References (18)
  • 1
    • 0348206156 scopus 로고    scopus 로고
    • and references therein
    • G.D. Watkins, J. Crystal Growth 159 (1996) 159, and references therein.
    • (1996) J. Crystal Growth , vol.159 , pp. 159
    • Watkins, G.D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.